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Cited article:

Experimental N V and Ne VIII low-temperature dielectronic recombination rate coefficients

S. Böhm, A. Müller, S. Schippers, W. Shi, M. Fogle, P. Glans, R. Schuch, H. Danared

A&A, 437 3 (2005) 1151-1157

Published online: 2005-06-30

DOI: https://doi.org/10.1051/0004-6361:20042500

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