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Cited article:

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Laser induced breakdown optical emission spectroscopic study of silicon plasma

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Measurement of Stark Halfwidths of Spectral Lines of Ionized Oxygen and Silicon Emitted from T-tube Plasma

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Atoms 7 (1) 8 (2019)
https://doi.org/10.3390/atoms7010008

Experimental Stark halfwidths of the ionized oxygen and silicon spectral lines

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Monthly Notices of the Royal Astronomical Society 457 (4) 4038 (2016)
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Experimental Stark widths and shifts for spectral lines of neutral and ionized atoms A critical review of selected data for the period 2001–2007

A. Lesage
New Astronomy Reviews 52 (11-12) 471 (2009)
https://doi.org/10.1016/j.newar.2008.01.001

Line broadening in the Si I, Si II, Si III, and Si IV spectra in the helium plasma

S. Bukvić, S. Djeniže and A. Srećković
Astronomy & Astrophysics 508 (1) 491 (2009)
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Application of laser-induced plasma spectroscopy to the measurement of Stark broadening parameters

J. Bengoechea, J.A. Aguilera and C. Aragón
Spectrochimica Acta Part B: Atomic Spectroscopy 61 (1) 69 (2006)
https://doi.org/10.1016/j.sab.2005.11.003