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Fig. 21

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MRS persistence detected in point source observation in 4-point dither pattern. First panel: data of the first dither and the five brightest peaks are filled in gray. A diffraction limited WebbPSF model, which is projected on the detector at the location of the observed point source. Second panel: at the location of the PSF peaks of dither 1, small excesses in flux are recorded in the signal of dither 2 (excess in flux shown by filled data in orange color). Third panel: persistence caused by dither 2 detector illumination on dither 3 data. Fourth panel: persistence caused by dither 3 detector illumination on dither 4 data.

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