Open Access

Fig. 5.

image

Download original image

Normalized distributions of three spectral parameters (log Teff, [Fe/H], and log g) of EWXs, and their relationships with log LX and log(LX/Lbol). Upper panels: normalized distributions of the binary temperature (1–1), metallicity [Fe/H] (2–1), and surface gravity log g (3–1). The red and black broken lines represent the EW-type binaries collected by Qian et al. (2017) and our Spec-EWX sample, respectively. Middle panels: relationships between log LX and the binary temperature (1–2), metallicity [Fe/H] (2–2), and surface gravity log g (3–2). Lower panels: relationships between log(LX/Lbol) and the binary temperature (1–3), metallicity [Fe/H] (2–3), and surface gravity log g (3–3). Solid black lines are the least-squares linear fits and the light black dashed lines represent the 95% uncertainty ranges.

Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.

Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.

Initial download of the metrics may take a while.