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Fig. 9.


Impact of shear measurement systematics on ξ± and ξE/B for four different types of shear measurement systematics; From the top down: PSF leakage, a repeating additive pattern, and random but correlated noise, correlated on chip and pointing scales (see Fig. 6). For ξ+ (magenta squares), ξ (green pluses) and ξE (blue diamonds) we present, in the left panels, the fractional difference between the measured signal in the systematic-induced KiDS-like SLICS mocks and the fiducial systematic-free case. As ξB (black crosses) and the E/B difference ξE − ξB (red pluses) tends to zero, we present, in the right panels, the difference between these measurements and the fiducial case, multiplied by the angular distance in arcminutes and scaled by 104. The measured B-modes can be compared to the expected shape-noise error for KiDS-450 (shaded area).

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