Impact of shear measurement systematics on ξ_± and ξ_E/B for four different types of shear measurement systematics; From the top down: PSF leakage, a repeating additive pattern, and random but correlated noise, correlated on chip and pointing scales (see Fig. 6). For ξ₊ (magenta squares), ξ₋ (green pluses) and ξ_E (blue diamonds) we present, in the left panels, the fractional difference between the measured signal in the systematic-induced KiDS-like SLICS mocks and the fiducial systematic-free case. As ξ_B (black crosses) and the E/B difference ξ_E − ξ_B (red pluses) tends to zero, we present, in the right panels, the difference between these measurements and the fiducial case, multiplied by the angular distance in arcminutes and scaled by 10⁴. The measured B-modes can be compared to the expected shape-noise error for KiDS-450 (shaded area).