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Fig. 10.


Impact of shear measurement systematics on E-mode (left) and B-mode (right) COSEBIs for four different types of shear measurement systematics; PSF leakage (blue squares), a repeating additive pattern (black stars), and random but correlated noise on chip (green triangles) and pointing (magenta diamonds) scales (see Fig. 6). The analysis is conducted for three different angular ranges spanning [0.5′,40′] (upper panels), [0.5′,100′] (middle panel), and [40′,100′] (lower panels). We present the difference between the measured signal in the systematic-induced KiDS-like SLICS mocks and the fiducial systematic-free case scaled by 1010. The measured B-modes and the resulting change to the E-mode can be compared to the expected shape-noise error for KiDS-450 (shaded area).

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