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Fig. 2.


Some of the lines used in the fit to obtain the rotational constants of SiC2 and its isotopologues. The fitted line profile is shown in red. Line identification is provided in each panel. Abscissa is frequency in MHz and the intensity scale corresponds to TA*. Numbers in each panel indicate the difference between laboratory frequencies (or predicted frequencies from laboratory data) minus the derived frequency of the lines observed towards IRC +10216 using the SHELL fitting method (see text).

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