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Fig. 2.

image

Histograms of the positional offset parameter (left panel), the reduced χ2 of the profile-fit photometry (middle panel), and the S/N (right panel) for ALLWISE (top panel) and NEOWISE-R (bottom panel). The cut-offs are shown as dashed lines (1″ for position, 10 for reduced χ2 and 3 for S/N). To distinguish between WISE1 and WISE2 bands, a slightly different bin size has been used for the WISE2 band.

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