Common baseline offset and gradient (C and m in Eq. (1), respectively) for the 102 science devices in the Gaia focal plane as measured in-orbit during the September 2016 calibration run. Formal error bars are smaller than the plotted points. For all SM and AF1, there is no measurement for the gradient as a function of sample binning because these operating modes have fixed binning of 2 pixels per sample.
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