Gaia Data Release 2 - Calibration and mitigation of electronic offset effects in the data

N. C. Hambly; M. Cropper; S. Boudreault; C. Crowley; R. Kohley; J. H. J. de Bruijne; C. Dolding; C. Fabricius; G. Seabroke; M. Davidson; N. Rowell; R. Collins; N. Cross; J. Martín-Fleitas; S. Baker; M. Smith; P. Sartoretti; O. Marchal; D. Katz; F. De Angeli; G. Busso; M. Riello; C. Allende Prieto; S. Els; L. Corcione; E. Masana; X. Luri; F. Chassat; F. Fusero; J. F. Pasquier; C. Vétel; G. Sarri; P. Gare

doi:10.1051/0004-6361/201832716

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Volume 616 (August 2018)

A&A, 616 (2018) A15

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Gaia Data Release 2

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Fig. 28

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Offset morphology in device SM1 in row 1 with one gate (upper panel) and all gates (lower panel) permanently active during calibration (y-axis units are ADU in both panels).

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