EDP Sciences
Gaia Data Release 2
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Fig. 20

image

Clipped mean residuals from validation of the full offset-corrected science data employing empty windows, and in the case of AF and XP, short gated integrations to eliminate systematic errors and shot noise contribution from photoelectric signal. For RVS, macrosample means were employed (see main text), while for AF and XP, individual sample means were used.

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