Top: change in the electronic bias in digitised units (ADU) as a function of pixel position in the serial register for two different window patterns as measured in on-ground pre-flight testing. Negative excursions with steep declines and slower recoveries are evident: these are associated with the flushes. Centre: pattern shown in time (units of “master clock” cycles of 50 ns, denoted Tmc), covering the duration of the readout of the serial register. This synchronises the pattern of glitches, as the timing of the pixel phases is unvarying. Bottom: excursions shown synchronised to the start of each window, for different patterns of flush and readout. The excursions are larger in the flushes (lower) than in the glitches (middle).
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