Correlation between EW Si II λ4130 and stretch measured for high S/N SNe Ia of the full VLT five year sample. The best-fit relation is EW (Si II) = (−139.3 ± 10.9) × s + (150.9 ± 10.8). The low stretch (s < 1.013) and high stretch (s ≥ 1.013) SNe Ia are shown as red filled circles and blue triangles, respectively.
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