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Table 5
Regional performance of the wavelet method on WASP-20 using a variety of wavelength ranges.
| Range | Teff (K) | [Fe/H] (dex) | log g (dex) | V sini (km s−1) |
|---|---|---|---|---|
| 450–500 nm | 5984 | − 0.17 | 4.31 | 3.98 |
| 500–550 nm | 6076 | −0.06 | 4.33 | 3.76 |
| 550–600 nm | 5530 | − 0.34 | 4.00 | 3.60 |
| 600–650 nm | 6099 | −0.12 | 4.96 | 3.45 |
| 400–600 nm | 5983 | − 0.11 | 4.50 | 3.63 |
| D15 | 6030 | 0.13 | 4.23 | 4.30 |
Notes. No priors for log g were used. 50 nm windows had 215 samples and the 200 nm windows had 217 samples. All were subject to the same analysis in Sect. 5 with no priors on log g.
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