Free Access

Fig. 1


Secondary eclipse binned photometry after PLD analysis in both 3.6 and 4.5 μm bands, normalized to unity in eclipse. Best fit solutions, with the intra-pixel effect removed, are overlaid in red. These are binned data, and the error bars are calculated from the scatter in each bin. The bottom panels show the residuals of each fit on an expanded scale.

Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.

Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.

Initial download of the metrics may take a while.