For each galaxy (rows): SPIRE FTS [Nii] 205 μm line emission maps at 17″ resolution (i.e. the beam size, indicated by a circle) superimposed on contours of constant 24 μm emission (left panels). The observed logarithms of the [Nii] 205 μm line flux density versus 24 μm continuum flux density (middle panels) and (right panels) are shown for each resolution element (blue circles). The scatter plots include the best linear fit (red solid line), 1σ confidence intervals (red dashed lines), the 1:1 relationship (dotted line), and the converted [Nii] 205-SFR relation from integrated measurements (black dashed line) found by Zhao et al. (2013). The grey lines for M 83 indicate the best fit and confidence intervals obtained when excluding central pixels (log ₁₀F₂₄(W m^-2 sr^-1) > −4.4). We state the Pearson and Spearman coefficients.