Effect of microturbulence on the derived v sin i and ΘRT when microturbulent broadening is not taken into account in the FT+GOF analysis. Black and gray curves indicate the derived broadening parameters resulting from the FT+GOF analysis of a Si iii line synthesized assuming two different values of microturbulence (5 and 20 km s-1, respectively). Top panel: derived (via FT) vs. input v sin i values. The positions of the zeroes associated with microturbulence are also indicated. Bottom panel: derived ΘRT values for the range of considered input v sin i values.
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