Fig. 4
Vignetting-corrected XMM-Newton images of Si xiii (1.85 keV), and S xv (2.4 keV). Both images were produced by following the same analysis that was used in Fig. 1. Observed X-ray emission from line elements are three sigmas above local background. White contours indicate the peripheral edge of total X-ray emission of G272.2−3.2.
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