Fig. 3

Ge IV (top), Ge V, and Ge VI (bottom) lines in FUSE, ORFEUS/BEFS (Ge IV λ 1189 Å), and IUE (Ge V λ 1222 Å, Ge IV λ 1229 Å) observations compared with a Teff = 70 kK/log g = 7.5 TMAP model. The abundances (top right) are logarithmic mass fractions. IG denotes a generic model atom (Rauch & Deetjen 2003), which comprises Ca, Sc, Ti, V, Cr, Mn, and Co. The synthetic spectra a convolved with a Gaussian of 0.05 Å (FWHM, 0.1 Å for the IUE comparison) to match the instrument resolution. A radial-velocity shift of vrad = 23 km s-1 is applied to the observation.
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