Fig. 13
a) Bias of the methods computed from our simulations as the mean of the
spurious deflection power on the unlensed set. For FS-inpainting, it corresponds to
in Eq. (8),
whereas for multi-patch, it is the result of applying the modified QE to
H0 as described in Sect. 4.5. b) Same plot with a log scale to emphasize the
low ℓ’s. No mode below 35 is available to the multi-patch method.
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