Table 1
Sample of the 33 candidates after performing the cut above χ12 ≥ 2 or χ22 ≥ 2.
Name | χ12 | χ22 | Quality |
|
|||
KIC 2853093 | 6.1 | 2.2 | 1 - ✓ |
KIC 9703198 | 4.2 | ... | 1 - ✓ |
KIC 6422367 | 4.0 | ... | 1 - ✓ |
KIC 4918309 | 2.2 | ... | 1 - ✓ |
KIC 6924203 | 2.2 | ... | 1 - ✓ |
KIC 9008220 | 2.2 | ... | 1 - ✓ |
KIC 10526549 | 2.1 | ... | 1 - ✓ |
WASP-46 | 3.2 | ... | 2 - Nearby sources in W3 |
KIC 3732821 | 2.6 | ... | 2 - Nearby source in W3 |
KIC 4545187 | 2.6 | ... | 2 - Slight offset in W3 |
KIC 6665695 | 0.8 | 2.2 | 2 - Nearby sources in W3 and W4 |
KIC 3547091 | 2.2 | ... | 2 - Slight offset in W3 |
KIC 8414716 | 2.2 | ... | 2 - Slight offset in W3 |
KIC 11288505 | 3.8 | ... | 3 - Extended in W3 |
KIC 6266741 | 3.4 | ... | 3 - Extended in W3 |
KIC 9513865 | 3.3 | 2.5 | 3 - Extended in W3 and W4 |
KIC 5184584 | 2.2 | 3.1 | 3 - Offset in W3; Extended in W4 |
KIC 7031517 | 3.0 | ... | 3 - Extended in W3 |
KIC 2309719 | 0.6 | 2.8 | 3 - Extended in W4 |
KIC 9007866 | ... | 2.8 | 3 - Offset in W3 |
KIC 10963242 | 2.5 | ... | 3 - Offset in W3 |
CoRoT-14 | 2.5 | ... | 3 - Artifact in W3 |
KIC 3833007 | ... | 2.4 | 3 - Offset in W3; Extended in W4 |
KIC 4544670 | 2.4 | ... | 3 - Extended in W3 |
KIC 7663405 | 2.3 | ... | 3 - Offset in W3 |
KIC 9214942 | 0.9 | 2.3 | 3 - Offset in W3; Extended in W4 |
KIC 3642741 | 2.2 | ... | 3 - Extended in W3 |
KIC 9757613 | 1.9 | 2.1 | 3 - Extended in W4 |
KIC 11446443 | 0.8 | 2.1 | 3 - Offset in W4; TrES-2 |
HAT-P-5 | 0.6 | 2.1 | 3 - Offset in W4 |
KIC 6692833 | 1.9 | 2.0 | 3 - Extended in W3 and W4 |
KIC 9391506 | ... | 2.0 | 3 - Offset in W3 and W4 |
CoRoT-8 | –1.4 | 2.0 | 3 - Offset in W4 |
Notes. From the SED fitting, typical uncertainties are 0.2 and 0.02 at 12 and 22 μm, respectively. Where marked as ellipsis (...), the WISE measurements are upper limits. For each candidate we have inspected the WISE images and established a quality parameter as: (1) Good, clear WISE detection; (2) Possible WISE detection; (3) Rejected. The reasons for rejection are clear image artifacts, offset in the photocenter of the image as compared to shorter wavelengths, and “extended” sources. “Extended” sources are ones in which the images show deformed PSFs, either due to a real extended object, to confusion with nearby objects, or to confusion with noise.
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