Table 2
Main characteristics of the highly absorbed X-ray sources.
| (1) | (2) | (3) | (4) | (5) | (6) | (7) | (8) | (9) | (10) |
| SRC | Name | RA | Dec | Error | Likelihood | Rate | fX | HR | Remarks |
| h:m:s | °:′:″ | arcsec | ( × 10-4 cts s-1) | erg cm-2 s-1 | |||||
|
|
|||||||||
| 01 | XMMUJ004102.6–732530 | 00:41:02.69 | –73:25:30.9 | 2.1 | 27.43 | 13.6 ± 2.9 | 8.94E–14 | 0.86 ± 0.23 | |
| 02 | XMMUJ004210.9–733011 | 00:42:10.90 | –73:30:11.8 | 2.0 | 16.80 | 12.4 ± 3.3 | 8.21E–14 | 1.00 ± 0.29 | |
| 03 | XMMUJ004226.3–730417 | 00:42:26.38 | –73:04:17.4 | 1.5 | 37.07 | 11.7 ± 2.0 | 7.76E–14 | 0.73 ± 0.20 | |
| 04 | XMMUJ004244.7–732356 | 00:42:44.77 | –73:23:56.4 | 2.1 | 15.34 | 5.9 ± 1.6 | 3.89E–14 | 0.80 ± 0.34 | |
| 05 | XMMUJ004536.2–724131 | 00:45:36.23 | –72:41:31.3 | 1.7 | 10.74 | 18.4 ± 5.8 | 1.18E–13 | 0.73 ± 0.29 | |
| 06 | XMMUJ004814.0–731006 | 00:48:14.07 | –73:10:06.0 | 1.5 | 58.28 | 55.4 ± 8.2 | 3.49E–13 | 0.73 ± 0.12 | XMMUJ004814.1-731003, SXP25.5 (1) |
| 07 | XMMUJ004818.7–732102 | 00:48:18.74 | –73:21:02.4 | 1.9 | >86 | 103 ± 9.1 | 6.81E–13 | 0.81 ± 0.08 | [SG2005] SMC 34 (2) |
| 08 | XMMUJ004853.5–732455 | 00:48:53.51 | –73:24:55.7 | 2.0 | >86 | 84.3 ± 8.2 | 5.71E–13 | 0.72 ± 0.07 | |
| 09 | XMMUJ004911.5–731717 | 00:49:11.57 | –73:17:17.8 | 1.8 | 12.79 | 15.1 ± 4.8 | 9.86E–14 | 0.91 ± 0.34 | CXOU J004910.7-731717 (3) |
| 10 | XMMUJ005020.7–720907 | 00:50:20.74 | –72:09:07.0 | 0.6 | >86 | 68.6 ± 5.3 | 4.51E–13 | 0.94 ± 0.05 | |
| 11 | XMMUJ005306.6–722400 | 00:53:06.66 | –72:24:00.2 | 1.5 | 12.96 | 6.0 ± 1.8 | 3.93E–14 | 0.72 ± 0.33 | |
| 12 | XMMUJ005322.4–715927 | 00:53:22.44 | –71:59:27.5 | 1.0 | 10.35 | 11.2 ± 3.6 | 7.41E–14 | 0.87 ± 0.36 | |
| 13 | XMMUJ005605.8–720012 | 00:56:05.85 | –72:00:12.2 | 1.6 | 26.57 | 8.4 ± 1.7 | 5.51E–14 | 0.70 ± 0.23 | New Be binary |
| 14 | XMMUJ005722.4–713114 | 00:57:22.44 | –71:31:14.8 | 0.9 | 12.66 | 15.7 ± 4.3 | 1.03E–13 | 0.72 ± 0.33 | |
| 15 | XMMUJ005724.3–715917 | 00:57:24.31 | –71:59:17.8 | 1.5 | 16.81 | 17.8 ± 4.6 | 1.20E–13 | 0.84 ± 0.29 | |
| 16 | XMMUJ005732.5–712926 | 00:57:32.51 | –71:29:26.3 | 1.8 | 8.93 | 11.3 ± 3.7 | 7.48E–14 | 0.86 ± 0.46 | |
| 17 | XMMUJ005735.8–721935 | 00:57:35.82 | –72:19:35.1 | 2.0 | 30.99 | 21.4 ± 4.5 | 1.45E–13 | 1.00 ± 0.18 | XMMU J005735.7-721932 (4) |
| CXOU J005736.2-721934, SXP565 (5) | |||||||||
| 18 | XMMUJ005812.9–723049 | 00:58:12.92 | –72:30:49.5 | 1.4 | >86 | 1330 ± 30 | 8.78E–12 | 0.77 ± 0.01 | RX J0058.2-7231, SXP293 (6) |
| 19 | XMMUJ010115.2–721640 | 01:01:15.28 | –72:16:40.6 | 2.1 | 13.14 | 19.7 ± 5.5 | 1.30E–13 | 0.82 ± 0.35 | |
| 20 | XMMUJ010233.9–723443 | 01:02:33.99 | –72:34:43.2 | 1.8 | 60.86 | 29.7 ± 4.9 | 1.90E–13 | 0.91 ± 0.17 | |
| 21 | XMMUJ010248.6–730822 | 01:02:48.69 | –73:08:22.6 | 1.4 | 39.22 | 28.2 ± 6.2 | 1.83E–13 | 0.77 ± 0.23 | |
| 21 | XMMUJ010432.5–722543 | 01:04:32.56 | –72:25:43.6 | 2.1 | 12.73 | 8.9 ± 2.5 | 5.81E–14 | 0.85 ± 0.36 | |
| 23 | XMMUJ010802.9–722627 | 01:08:02.93 | –72:26:27.5 | 2.1 | 17.50 | 7.9 ± 2.2 | 5.21E–14 | 0.71 ± 0.30 | |
| 24 | XMMUJ010811.9–721005 | 01:08:11.91 | –72:10:05.2 | 1.2 | 24.42 | 7.0 ± 1.6 | 4.61E–14 | 0.81 ± 0.27 | |
| 25 | XMMUJ010831.4–730630 | 01:08:31.40 | –73:06:30.9 | 1.6 | 39.61 | 12.1 ± 2.1 | 7.98E–14 | 0.93 ± 0.19 | |
| 26 | XMMUJ010842.6–723839 | 01:08:42.68 | –72:38:39.6 | 1.8 | 25.94 | 39.5 ± 8.0 | 2.56E–13 | 0.79 ± 0.17 | |
| 27 | XMMUJ010908.0–720642 | 01:09:08.09 | –72:06:42.1 | 1.3 | 13.52 | 6.3 ± 1.9 | 4.11E–14 | 0.85 ± 0.35 | |
| 28 | XMMUJ011339.7–724733 | 01:13:39.74 | –72:47:33.3 | 2.0 | 11.87 | 15.0 ± 4.8 | 1.01E–13 | 0.86 ± 0.31 | |
| 29 | XMMUJ011434.8–730730 | 01:14:34.83 | –73:07:30.4 | 2.2 | 10.66 | 14.7 ± 4.7 | 9.70E–14 | 0.70 ± 0.29 | |
| 30 | XMMUJ011807.8–731713 | 01:18:07.84 | –73:17:13.9 | 2.2 | 16.17 | 24.6 ± 6.3 | 1.60E–13 | 0.85 ± 0.23 | |
Notes. Key to table: Col. (1) = source ID; Col. (2) = source catalogue name; Col. (3) = right ascension (J2000); Col. (4) = declination (J2000); Col. (5) = position error (1 σ c.l.); Col. (6) = detection likelihood; Col. (7) = 3–10 keV count rate (sum of the PN and MOS counts divided by the sum of PN and MOS exposures); Col. (8) = X-ray flux in the energy band 3–10 keV, assuming a power-law emission model with a hydrogen column density NH > 3 × 1023 cm-2 and a photon-index Γ = 1.5; Col. (9) = hardness ratio between energy bands 1–3 keV and 3–10 keV; Col. (10) = likely identification with already known sources.
References. References are given in parenthesis: (1) Haberl et al. (2008b); (2) Shtykovskiy & Gilfanov (2005); (3) Laycock et al. (2010); (4) Sasaki et al. (2003), Haberl et al. (2008a); (5) Macomb et al. (2003); (6) Haberl et al. (2008a).
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