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Fig. 10


Correlation coefficents (top) and regression slopes (bottom) between SIM and SATIRE-S as a function of wavelength for the spectrum from 200 − 1630 nm. For λ < 450 nm wavelengths are compared in 10 nm bins; for λ > 450 nm bins are resolution elements of SIM. There are three types of comparison made for each bin over the time period of 21 April 2004 to 1 November 2009: (black) original data, (red) detrended, short-term and (green) smoothed or long-term. Greyed-out regions highlight the detector edges where the signal is comparable to the instrument noise. Dotted lines are to aid the reader.

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