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Fig. 2
Distribution of EW with Hubble Type for the cluster Sa–Sc sample split into disturbed (open triangles) and undisturbed (filled triangles) objects. Solid lines show the 2σ field limits from Fig. 1. Typical errors in EW are ~5–15% for high EW (>2 nm), 15–25% for moderate EW (1–2 nm) and 25–100% for low EW (<1 nm) objects.
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