Submillimeter number counts at 250 μm, 350 μm and 500 μm in BLAST data

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Volume 516 (June-July 2010)

A&A, 516 (2010) A43

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Table 1:

95% completeness flux density and photometric noise for different depths at different wavelengths.
	95% completeness		Instrumental noise		Total photometric noise		Deduced confusion noise
	mJy		mJy		mJy		mJy
	Shallow	Deep	Shallow	Deep	Shallow	Deep	Shallow	Deep
250 $\mu$ m	203	97	37.7	11.1	47.3	24.9	28.6	22.3
350 $\mu$ m	161	83	31.6	9.3	35.8	20.3	16.8	18.0
500 $\mu$ m	131	76	20.4	6.0	26.4	17.6	16.7	16.5

Notes. The instrumental noise is given by the noise map. The total photometric noise includes the instrumental and confusion noise and is determined by Monte-Carlo simulations. The confusion noise is computed with the formula $\sigma_{\rm conf} = \sqrt{\sigma_{\rm tot}^2-\sigma_{\rm instr}^2}$ .

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