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Table 1:

Basic X-ray parameters of SPT-CL J2332-5358 and SPT-CL J2342-5411.

Parameter 		SPT-CL J2332-5358 SPT-CL J2342-5411 Units
$\alpha$ (J2000)a      $23^{{\rm h}}32^{{\rm m}}26.7^{{\rm s}}$      $23^{{\rm h}}42^{{\rm m}}45.8^{{\rm s}}$  
$\delta$ (J2000)a $-53\degr58\hbox{$^\prime$ }20.4\hbox{$^{\prime\prime}$ }$ $-54\degr10\hbox{$^\prime$ }59.2\hbox{$^{\prime\prime}$ }$  
photometric redshift 0.32b 1.08b  
F500 [0.5-2.0 keV] $9.52 \pm 0.51 $ $0.58 \pm 0.06 $ 10-13 erg cm-2 s-1
L500 [0.5-2.0 keV] $2.71 \pm 0.15 $ $2.86 \pm 0.29 $ 1044 erg s-1
T500 $9.3 \pm 2.6$c $4.5 \pm 1.3$f keV
r500 $1.3 \pm 0.2$d $0.6 \pm 0.1$d Mpc
M500 $8.8 \pm 3.8 $d $1.9 \pm 0.8$d $ 10^{14}~M_{\hbox{$\odot$ }}$
$Y_{{\rm X},500}$ $11.6 \pm 9.7$e $1.1 \pm 0.7$g $ 10^{14}~M_{\hbox{$\odot$ }}$ keV
r200 $2.0 \pm 0.3$d $0.9\pm0.1$d Mpc
M200 $12.4 \pm 5.4 $d $2.7 \pm 1.2 $d $ 10^{14}~M_{\hbox{$\odot$ }}$

Notes. Flux and luminosity errors include the Poisson errors and a 5% systematic error in the background estimation. Errors of parameters obtained from scaling relations include the measurement errors of the luminosity and temperature, respectively, and the intrinsic scatter of the scaling relations. We assume self-similar evolution for all the scaling relations and no evolution of their intrinsic scatters (see Sect. 2.2.1). (a) X-ray coordinates based on a maximum-likelihood fit of a PSF-folded beta model to the surface brightness distribution; (b) High et al. (2010); (c) spectroscopic temperature (Sect. 2.2.1), error bars averaged, assuming isothermality; (d) M-T relation from Arnaud et al. (2005), using relations for T >3.5 keV, self-similar evolution, radii calculated analytically from the mass estimates; (e)  $M_{500}{-}Y_{{\rm X}}$ relation (Arnaud et al. 2007). (f) L-T relation from Pratt et al. (2009), self-similar evolution, relation for the 0.5-2 keV luminosity, BCES orthogonal fit; (g)  $L{-}Y_{{\rm X}}$ relation from Pratt et al. (2009), self-similar evolution, relation for the 0.5-2 keV luminosity, BCES orthogonal fit. YX, the X-ray analogue to the Comptonization parameter Y, is the product of the gas mass and temperature (e.g. Kravtsov et al. 2006).


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