Unlocking ultra-deep wide-field imaging with sidereal visibility averaging J. M. G. H. J. de Jong, R. J. van Weeren, T. J. Dijkema, J. B. R. Oonk, H. J. A. Röttgering and F. Sweijen A&A, 694 (2025) A98 Published online: 06 February 2025 DOI: 10.1051/0004-6361/202452492