Our non-LTE calculations for the Sun are based on the model atom
described above and employ the empirical model atmosphere of
Holweger & Müller (1974).
In Figs. 2 and 3 the
resulting departure coefficients
are shown for a calculation with the model atom for Si I and Si II,
respectively.
The numbers on the left of the diagrams correspond to energy level numbers
specified in Table 1.
In the solar photosphere at
about
of the silicon atoms are neutral while
are singly ionized. Our calculations show that
most of Si II is present in the ground state.
Therefore it is not surprising that the corresponding departure
coefficient indicates almost perfect LTE conditions (
)
in the Sun. The same is true for the ground state of Si I.
Furthermore, throughout the photosphere (
),
deviations from LTE are almost negligible for excited levels of
Si I. In contrast, most excited levels of Si II are overpopulated with
respect to LTE.
In both ionization stages there are groups of energy levels whose
departure coefficients closely coincide.
This is due to very small energy differences within these groups and
consequently a strong collisional coupling.
To enable a direct comparision between former LTE abundance
determinations and the present work, the line list
(Table 3) is essentially that adopted by
Holweger (1973),
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mult. | ![]() |
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(Å) | nr. | (eV) | (mÅ) | |||
Si I: | ||||||
5645.611 | 10 | 4.9296 | -2.040 | 34 | 7.535 | -0.004 |
5665.554 | 10 | 4.9201 | -1.940 | 40 | 7.532 | -0.004 |
5684.485 |
11 | 4.9538 | -1.550 | 60 | 7.485 | -0.007 |
5690.427 | 10 | 4.9296 | -1.770 | 52 | 7.563 | -0.006 |
5701.105 | 10 | 4.9296 | -1.950 | 38 | 7.514 | -0.005 |
5708.397 | 10 | 4.9538 | -1.370 | 78 | 7.550 | -0.011 |
5772.145 |
17 | 5.0823 | -1.650 | 54 | 7.599 | -0.008 |
5780.384 | 9 | 4.9201 | -2.250 | 26 | 7.577 | -0.004 |
5793.071 | 9 | 4.9296 | -1.960 | 44 | 7.623 | -0.005 |
5797.860 | 9 | 4.9538 | -1.950 | 40 | 7.567 | -0.005 |
5948.540 |
16 | 5.0823 | -1.130 | 86 | 7.508 | -0.015 |
6976.520 | 60 | 5.9537 | -1.070 | 43 | 7.532 | ![]() |
7034.901 | 42.10 | 5.8708 | -0.780 | 67 | 7.493 |
![]() |
7226.208 |
21.05 | 5.6135 | -1.410 | 36 | 7.498 | -0.005 |
7680.265 | 36 | 5.8625 | -0.590 | 98 | 7.626 |
![]() |
7918.382 | 57 | 5.9537 | -0.510 | 95 | 7.565 | ![]() |
7932.348 |
57 | 5.9639 | -0.370 | 97 | 7.451 | ![]() |
7970.305 | 57 | 5.9639 | -1.370 | 32 | 7.663 | ![]() |
Si II: | ||||||
6347.110 | 2 | 8.1210 | 0.260 | 56 | 7.639 |
![]() |
6371.370 | 2 | 8.1210 | -0.040 | 36 | 7.521 |
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a | Larger error in oscillator strength. |
b | Strongly sensitive to collisional line broadening. |
c | Susceptable to uncertainties in model atom. |
![]() |
Figure 4:
Solar silicon abundance for the lines in
Table 3 over equivalent width ![]() |
![]() |
Figure 5:
Solar silicon abundance for the lines in
Table 3: a) Corrected oscillator
strengths by Garz (1973) and Becker et al. (1980).
b) Oscillator strengths by Fuhr & Wiese
(1998). Filled symbols represent non-LTE values, unfilled
LTE abundances (circles for Si I, squares for
Si II). The horizontal lines illustrate the weighted mean and the
standard deviation (solid) and the former (and confirmed) abundance of
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model assumption |
![]() |
![]() |
![]() |
standard model |
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-0.010 | |
Non-LTE calculations: | |||
no Stark broadening |
![]() |
-0.010 | 0.000 |
![]() |
![]() |
-0.010 | 0.000 |
![]() |
![]() |
-0.011 | -0.001 |
no line transitions |
![]() |
+0.005 | +0.015 |
all
![]() |
![]() |
-0.011 | -0.001 |
all
![]() |
![]() |
-0.011 | -0.001 |
all
![]() |
![]() |
-0.009 | +0.001 |
all
![]() |
![]() |
-0.017 | -0.007 |
all
![]() |
![]() |
-0.003 | +0.007 |
all
![]() |
![]() |
-0.015 | -0.005 |
all
![]() |
![]() |
-0.004 | +0.006 |
Abundance analysis: | |||
![]() |
![]() |
-0.010 | 0.000 |
![]() |
![]() |
-0.009 | -0.007 |
![]() |
![]() |
-0.010 | +0.015 |
![]() |
![]() |
-0.009 | -0.025 |
no Stark broadening |
![]() |
-0.011 | +0.032 |
![]() |
![]() |
-0.009 | -0.031 |
![]() |
![]() |
-0.008 | -0.056 |
![]() |
![]() |
-0.010 | +0.012 |
ATLAS |
![]() |
-0.008 | -0.102 |
For the present calculations, always static, plane-parallel models are
applied which cannot account for horizontal temperature
inhomogeneities associated with convection.
These inhomogeneities are believed to have a small but non-negligible
effect on the photospheric abundances, making further corrections
necessary. In a first attempt, Steffen (2000a)
determined abundance corrections for various elements from 2D
hydrodynamics simulations which yield temperature and pressure
fluctuations of the solar surface. Through comparison of 1D and 2D models,
both with a depth-independent microturbulence of
,
the effect of temperature inhomogenities on the abundance can be
determined. A first application is reported in Aellig et al.
(1999). A more detailed description will be given in Steffen
& Holweger (2001).
For the case of silicon, M. Steffen (2000b) kindly provided
granulation abundance corrections for 10 representative line
transistions which permitted an interpolation for the remaining lines
in Table 3. The resulting abundance corrections depend
on the excitation potential
and equivalent width. The mean
granulation abundance correction for Si I line transitions with
eV is +0.023 and increases to 0.029 dex
for
eV. The abundance corrections for the
two Si II lines are
-0.014. Considering the same weights as in the abundance
determination above, a total correction of +0.021 due to granulation
results. Finally, the photospheric silicon abundance becomes
,
including granulation effects.
In 3D simulations, temperature fluctuations are in general smaller than
in 2D. Therefore the granulation abundance correction described here
should be considered as an upper limit.
Copyright ESO 2001