All Figures

$\begin{figure} \par\includegraphics[height=3.1in,width=3.1in]{8675_f1.ps} \end{figure}$ Figure 1: Wide angle X-ray diffraction patterns showing development of crystallinity in annealed Product I silicate. Patterns in this and subsequent figures have been offset in the y-axis direction for clarity.
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In the text

$\begin{figure} \par\includegraphics[height=3.1in,width=3.1in]{8675_f2.ps} \end{figure}$ Figure 2: Wide angle X-ray diffraction patterns for annealed samples of the Product II and III silicates. The absence of sharp diffraction peaks indicates an absence of long-range crystalline structure.
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In the text

$\begin{figure} \par\includegraphics[height=3.1in,width=3.1in]{8675_f3.ps} \end{figure}$ Figure 3: Measured Mg K-edge XANES spectra for forsterite and enstatite mineral samples, with the main features labelled A to F.
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In the text

$\begin{figure} \par\includegraphics[height=3.1in,width=3.1in]{8675_f4.ps} \end{figure}$ Figure 4: Measured Mg K-edge XANES spectra for unprocessed samples of the high-, medium- and low-Mg Product I, II and III silicates. Feature labels as per Fig. 3.
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In the text

$\begin{figure} \par\includegraphics[height=3.1in,width=3.1in]{8675_f5.ps} \end{figure}$ Figure 5: Thermal evolution of the measured Mg K-edge XANES spectra for annealed samples of the high-Mg content Product I silicate. Feature labels as per Fig. 3.
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In the text

$\begin{figure} \par\includegraphics[height=3.1in,width=3.1in]{8675_f6.ps} \end{figure}$ Figure 6: Thermal evolution of measured Mg K-edge XANES spectra for annealed samples of the medium Mg-content Product II silicate. Feature labels as per Fig. 3.
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In the text

$\begin{figure} \par\includegraphics[height=3.1in,width=3.1in]{8675_f7.ps} \end{figure}$ Figure 7: Thermal evolution of measured Mg K-edge XANES for annealed samples of the low Mg-content Product III silicate. Feature labels as per Fig. 3.
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In the text

$\begin{figure} \par\includegraphics[height=3.1in,width=3.1in]{8675_f8.ps} \end{figure}$ Figure 8: Calculated Mg K-edge XANES for clusters of radius of 2 Å centred on an Mg atom and based on crystalline Clino-Enstatite, Orthorhombic Enstatite and Forsterite structures, showing contribution of short-range order to XANES morphology.
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In the text

$\begin{figure} \par\includegraphics[height=3.1in,width=3.1in]{8675_f9.ps} \end{figure}$ Figure 9: Calculated Mg K-edge XANES for 5 Å radius clusters centred on an Mg atom for crystalline Clino-Enstatite, Orthorhombic Enstatite and Forsterite structures showing effect of increasing ordered cluster size on XANES morphology. Ordered medium-range structure results in formation of fine structure features.
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In the text

$\begin{figure} \par\includegraphics[height=3.1in,width=3.1in]{8675_f10.ps} \end{figure}$ Figure 10: Si K-edge XANES spectra measured for amorphous and crystalline (Quartz) SiO₂, with the main features labelled G to K.
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In the text

$\begin{figure} \par\includegraphics[height=3.1in,width=3.1in]{8675_f11.ps} \end{figure}$ Figure 11: Si K-edge XANES spectra measured for forsterite and enstatite mineral samples, with feature labels as per Fig. 10.
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In the text

$\begin{figure} \par\includegraphics[height=3.1in,width=3.1in]{8675_f12.ps} \end{figure}$ Figure 12: Meaured Si K-edge XANES spectra for unprocessed samples of the high-, medium- and low-Mg Products I, II and III. Feature labels as per Fig. 10.
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In the text

$\begin{figure} \par\includegraphics[height=3.1in,width=3.1in]{8675_f13.ps} \end{figure}$ Figure 13: Evolution of measured Si K-edge XANES spectra with annealing temperature for the high-Mg Product I silicate. Feature labels as per Fig. 10.
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In the text

$\begin{figure} \par\includegraphics[height=3.1in,width=3.1in]{8675_f14.ps} \end{figure}$ Figure 14: Evolution of measured Si K-edge XANES spectra with annealing temperature for samples of the medium-Mg Product II. Featurelabels as per Fig. 10.
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In the text

$\begin{figure} \par\includegraphics[height=3.1in,width=3.1in]{8675_f15.ps} \end{figure}$ Figure 15: Evolution of measured Si K-edge XANES spectra with annealing temperature for samples of the low-Mg Product III. Feature labels as per Fig. 10.
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In the text

$\begin{figure} \par\includegraphics[height=3.1in,width=3.1in]{8675_f16.ps} \end{figure}$ Figure 16: Calculated Si K-edge XANES for the first Si-O coordination shell for Clino-Enstatite, Orthorhombic Enstatite and Forsterite structures, showing contribution of short-range order to XANES morphology.
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In the text

$\begin{figure} \par\includegraphics[height=3.1in,width=3.1in]{8675_f17.ps} \end{figure}$ Figure 17: Calculated Si K-edge XANES for 5 Å Clino-Enstatite cluster, 5 Å Orthorhombic Enstatite cluster and 4.5 Å forsterite cluster each centred on a Si atom, showing effect of increasing ordered cluster size on XANES morphology. Ordered medium-range structure results in formation of fine structure features
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In the text

$\begin{figure} \par\includegraphics[height=3.1in,width=3.1in]{8675_f18.ps} \end{figure}$ Figure 18: X-ray scattering feature measured at low values of the X-ray scattering wavevector for amorphous SiO₂. X-axis units are Å^-1. The single peak is located at 1.603 Å^-1, corresponding to values of r=1.56 Å for the short-range order bond length and D=3.92 Å for the pseudo-ordered inter-cluster distance.
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In the text

$\begin{figure} \par\includegraphics[height=3.1in,width=3.1in]{8675_f19.ps} \end{figure}$ Figure 19: X-ray scattering features measured at low values of the X-ray scattering wavevector for samples of the high-Mg Product I silicate annealed below its crystallisation temperature. For the three features labelled (1) to (3) short-range order bond lengths, r, of 1.66₍₁₎, 1.31₍₂₎, 1.01₍₃₎ Å are obtained for the unprocessed sample and 1.66₍₁₎, 1.35₍₂₎, 1.01₍₃₎ Å for the 900 K sample. Pseudo-ordered inter-cluster distances, D, of 4.17₍₁₎, 3.30₍₂₎, 2.54₍₃₎ for the unprocessed sample and 4.16₍₁₎, 3.39₍₂₎, 2.54₍₁₎ for the 900 K sample are obtained.
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In the text

$\begin{figure} \par\includegraphics[height=3.1in,width=3.1in]{8675_f20.ps} \end{figure}$ Figure 20: X-ray scattering features measured at low values of the X-ray scattering wavevector for annealed samples of the medium-Mg Product II silicate. For the features labelled (1) to (3) short-range order bond lengths, r, of 1.73₍₁₎, 1.30₍₂₎, 1.01₍₃₎ Å are obtained for the unprocessed sample, 1.75₍₁₎, 1.30₍₂₎ Å for the 1000 K sample and 1.37₍₂₎, 1.03₍₃₎ Å for the 1300 K sample. Corresponding pseudo-ordered inter-cluster distances, D, of 4.34₍₁₎, 3.27₍₂₎, 2.53₍₃₎ are obtained for the unprocessed sample, 4.41₍₁₎, 3.27₍₂₎, for the 1000 K sample and 3.441₍₂₎, 2.59₍₃₎, for the 1300 K sample.
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In the text

$\begin{figure} \par\includegraphics[height=3.1in,width=3.1in]{8675_f21.ps} \end{figure}$ Figure 21: X-ray scattering feature measured at low values of the X-ray scattering wavevector for annealed samples of the low-Mg Product III silicate. The single peak is located at 1.829, 1.749, 1.66 Å^-1 for the unprocessed, 1000 K and 1300 K samples respectively, corresponding to short-range order bond length values, r, of 1.37, 1.43, 1.51 Å and pseudo-ordered inter-cluster distances, D, of 3.44, 3.59, 3.78 Å respectively.
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In the text

$\begin{figure} \par\includegraphics[height=3.1in,width=3.1in]{8675_f22.ps} \end{figure}$ Figure 22: Effect of energy dependent broadening on Mg K-edge forsterite XANES. Bottom plot is the calculated spectrum for a cluster radius (C.R.) of 3.5 Å without energy dependent broadening; middle is for a 5 Å radius cluster without energy dependent broadening; top plot is for the same 5 Å cluster but including contributions from energy dependent broadening.
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In the text

$\begin{figure} \par\includegraphics[height=3.1in,width=3.1in]{8675_f1.ps} \end{figure}$	Figure 1: Wide angle X-ray diffraction patterns showing development of crystallinity in annealed Product I silicate. Patterns in this and subsequent figures have been offset in the y-axis direction for clarity.
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$\begin{figure} \par\includegraphics[height=3.1in,width=3.1in]{8675_f2.ps} \end{figure}$	Figure 2: Wide angle X-ray diffraction patterns for annealed samples of the Product II and III silicates. The absence of sharp diffraction peaks indicates an absence of long-range crystalline structure.
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$\begin{figure} \par\includegraphics[height=3.1in,width=3.1in]{8675_f3.ps} \end{figure}$	Figure 3: Measured Mg K-edge XANES spectra for forsterite and enstatite mineral samples, with the main features labelled A to F.
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$\begin{figure} \par\includegraphics[height=3.1in,width=3.1in]{8675_f4.ps} \end{figure}$	Figure 4: Measured Mg K-edge XANES spectra for unprocessed samples of the high-, medium- and low-Mg Product I, II and III silicates. Feature labels as per Fig. 3.
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$\begin{figure} \par\includegraphics[height=3.1in,width=3.1in]{8675_f5.ps} \end{figure}$	Figure 5: Thermal evolution of the measured Mg K-edge XANES spectra for annealed samples of the high-Mg content Product I silicate. Feature labels as per Fig. 3.
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$\begin{figure} \par\includegraphics[height=3.1in,width=3.1in]{8675_f6.ps} \end{figure}$	Figure 6: Thermal evolution of measured Mg K-edge XANES spectra for annealed samples of the medium Mg-content Product II silicate. Feature labels as per Fig. 3.
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$\begin{figure} \par\includegraphics[height=3.1in,width=3.1in]{8675_f7.ps} \end{figure}$	Figure 7: Thermal evolution of measured Mg K-edge XANES for annealed samples of the low Mg-content Product III silicate. Feature labels as per Fig. 3.
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$\begin{figure} \par\includegraphics[height=3.1in,width=3.1in]{8675_f8.ps} \end{figure}$	Figure 8: Calculated Mg K-edge XANES for clusters of radius of 2 Å centred on an Mg atom and based on crystalline Clino-Enstatite, Orthorhombic Enstatite and Forsterite structures, showing contribution of short-range order to XANES morphology.
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$\begin{figure} \par\includegraphics[height=3.1in,width=3.1in]{8675_f9.ps} \end{figure}$	Figure 9: Calculated Mg K-edge XANES for 5 Å radius clusters centred on an Mg atom for crystalline Clino-Enstatite, Orthorhombic Enstatite and Forsterite structures showing effect of increasing ordered cluster size on XANES morphology. Ordered medium-range structure results in formation of fine structure features.
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$\begin{figure} \par\includegraphics[height=3.1in,width=3.1in]{8675_f10.ps} \end{figure}$	Figure 10: Si K-edge XANES spectra measured for amorphous and crystalline (Quartz) SiO₂, with the main features labelled G to K.
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$\begin{figure} \par\includegraphics[height=3.1in,width=3.1in]{8675_f11.ps} \end{figure}$	Figure 11: Si K-edge XANES spectra measured for forsterite and enstatite mineral samples, with feature labels as per Fig. 10.
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$\begin{figure} \par\includegraphics[height=3.1in,width=3.1in]{8675_f12.ps} \end{figure}$	Figure 12: Meaured Si K-edge XANES spectra for unprocessed samples of the high-, medium- and low-Mg Products I, II and III. Feature labels as per Fig. 10.
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$\begin{figure} \par\includegraphics[height=3.1in,width=3.1in]{8675_f13.ps} \end{figure}$	Figure 13: Evolution of measured Si K-edge XANES spectra with annealing temperature for the high-Mg Product I silicate. Feature labels as per Fig. 10.
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$\begin{figure} \par\includegraphics[height=3.1in,width=3.1in]{8675_f14.ps} \end{figure}$	Figure 14: Evolution of measured Si K-edge XANES spectra with annealing temperature for samples of the medium-Mg Product II. Featurelabels as per Fig. 10.
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$\begin{figure} \par\includegraphics[height=3.1in,width=3.1in]{8675_f15.ps} \end{figure}$	Figure 15: Evolution of measured Si K-edge XANES spectra with annealing temperature for samples of the low-Mg Product III. Feature labels as per Fig. 10.
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$\begin{figure} \par\includegraphics[height=3.1in,width=3.1in]{8675_f16.ps} \end{figure}$	Figure 16: Calculated Si K-edge XANES for the first Si-O coordination shell for Clino-Enstatite, Orthorhombic Enstatite and Forsterite structures, showing contribution of short-range order to XANES morphology.
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$\begin{figure} \par\includegraphics[height=3.1in,width=3.1in]{8675_f17.ps} \end{figure}$	Figure 17: Calculated Si K-edge XANES for 5 Å Clino-Enstatite cluster, 5 Å Orthorhombic Enstatite cluster and 4.5 Å forsterite cluster each centred on a Si atom, showing effect of increasing ordered cluster size on XANES morphology. Ordered medium-range structure results in formation of fine structure features
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$\begin{figure} \par\includegraphics[height=3.1in,width=3.1in]{8675_f18.ps} \end{figure}$	Figure 18: X-ray scattering feature measured at low values of the X-ray scattering wavevector for amorphous SiO₂. X-axis units are Å^-1. The single peak is located at 1.603 Å^-1, corresponding to values of r=1.56 Å for the short-range order bond length and D=3.92 Å for the pseudo-ordered inter-cluster distance.
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$\begin{figure} \par\includegraphics[height=3.1in,width=3.1in]{8675_f22.ps} \end{figure}$	Figure 22: Effect of energy dependent broadening on Mg K-edge forsterite XANES. Bottom plot is the calculated spectrum for a cluster radius (C.R.) of 3.5 Å without energy dependent broadening; middle is for a 5 Å radius cluster without energy dependent broadening; top plot is for the same 5 Å cluster but including contributions from energy dependent broadening.
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