Table 9: Abundance patterns of the integrated profiles for our sample of 11 DLAs.
Element # DLAs Mean a rms b $\chi _{\nu }^2$ c

[X/Si]
N ..... 7 -1.089 (-1.126) 0.225 (0.195) 7.65 (7.772)
Mg ... 5 0.238 (0.197) 0.447 (0.405) 38.37 (30.345)
P ..... 4 -0.127 (-0.173) 0.193 (0.176) 6.44 (4.872)
S ..... 8 0.001 (-0.032) 0.129 (0.121) 2.06 (1.785)
Ar ..... 3 -0.608 (-0.662) 0.138 (0.200) 2.31 (2.666)
Ti ..... 4 -0.147 (-0.295) 0.327 (0.226) 10.28 (5.114)
Cr .... 9 -0.314 (-0.359) 0.148 (0.186) 6.01 (9.229)
Mn ... 9 -0.656 (-0.695) 0.102 (0.140) 3.57 (5.688)
Fe .... 10 -0.436 (-0.436) 0.115 (0.115) 6.27 (6.266)
Ni .... 7 -0.404 (-0.417) 0.109 (0.087) 4.07 (1.945)
Zn .... 8 0.007 (-0.042) 0.174 (0.177) 9.73 (10.444)
[X/Fe]
N ..... 8 -0.678 (-0.706) 0.278 (0.244) 12.96 (13.428)
Mg ... 6 0.685 (0.645) 0.376 (0.353) 28.22 (23.584)
Si ..... 10 0.430 (0.430) 0.114 (0.114) 6.63 (6.630)
P ..... 5 0.241 (0.193) 0.277 (0.272) 9.62 (9.265)
S ..... 9 0.331 (0.303) 0.195 (0.191) 4.22 (3.699)
Ar ..... 4 -0.092 (-0.140) 0.234 (0.270) 4.64 (5.150)
Ti ..... 4 0.261 (0.076) 0.379 (0.233) 15.59 (6.765)
Cr ..... 10 0.131 (0.092) 0.060 (0.107) 0.66 (3.582)
Mn ... 9 -0.227 (-0.271) 0.053 (0.077) 1.69 (2.515)
Ni ..... 7 0.022 (0.007) 0.085 (0.068) 2.42 (1.174)
Zn ..... 9 0.396 (0.329) 0.217 (0.199) 26.51 (23.241)
Note. The numbers in parentheses correspond to the abundance ratios [X/Si] and [X/Fe] computed by considering all of the gas in the Si II and Fe II profiles in comparison to the adopted method (see Sect. 4).

a Logarithmic weighted mean of [X/Si] and [X/Fe] using their
1$\sigma $ errors as weights.
b Logarithmic rms dispersion in [X/Si] and [X/Fe].
c Reduced $\chi ^2$ of [X/Si] and [X/Fe] relative to their weighted mean.

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