Table 2: Performed and useful exposure times for all XMM-Newton instruments. The useful RGS exposure time is considerably reduced due to a strong flare of soft protons. The fourth column yields the background-corrected count rate for the source, between 0.4 and 10 keV for EPIC, and between 0.3 and 2.5 keV for RGS. In the case of the RGS instruments, only exposure 0001730201 is considered. The error bars on the count rate represent the $\pm$ 1 $\sigma$ standard deviation.
Instrument Performed Effective Background-corrected

duration exposure count rate

(s) (s) (count s^-1)

MOS1 25 901 25 435 0.512 $\pm$ 0.005

MOS2 25 906 25 473 0.532 $\pm$ 0.005

pn 22 759 20 402 1.303 $\pm$ 0.009

RGS1 16 495 7490 0.085 $\pm$ 0.006

RGS2 16 535 6838 0.101 $\pm$ 0.006

**Table 2:** Performed and useful exposure times for all *XMM-Newton* instruments. The useful RGS exposure time is considerably reduced due to a strong flare of soft protons. The fourth column yields the background-corrected count rate for the source, between 0.4 and 10 keV for EPIC, and between 0.3 and 2.5 keV for RGS. In the case of the RGS instruments, only exposure 0001730201 is considered. The error bars on the count rate represent the $\pm$ 1 $\sigma$ standard deviation.
Instrument	Performed	Effective	Background-corrected
	duration	exposure	count rate
	(s)	(s)	(count s^-1)
MOS1	25 901	25 435	0.512 $\pm$ 0.005
MOS2	25 906	25 473	0.532 $\pm$ 0.005
pn	22 759	20 402	1.303 $\pm$ 0.009
RGS1	16 495	7490	0.085 $\pm$ 0.006
RGS2	16 535	6838	0.101 $\pm$ 0.006

Source LaTeX | All tables | In the text