A&A 393, 721-726 (2002)
DOI: 10.1051/0004-6361:20021174
V. Milosavljevic1,2 - S. Djenize1,2,3
1 - Faculty of Physics, University of Belgrade, PO Box 368, Belgrade, Serbia, Yugoslavia
2 -
Isaac Newton Institute of Chile, Yugoslavia Branch, Belgrade, Yugoslavia
3 -
Hungarian Academy of Sciences, Budapest, Hungary
Received 16 May 2002 / Accepted 9 August 2002
Abstract
Characteristics of the astrophysical important Stark
broadened 447.15 nm, 587.56 nm and 667.82 nm He I
spectral line profiles have been measured at electron densities
between 0.310
and 8.2
10
m
and electron temperatures between 8000 and 33 000
K in plasmas created in five various discharge conditions using a
linear, low-pressure, pulsed arc as an optically thin plasma
source operated in a helium-nitrogen-oxygen gas mixture. On the
basis of the observed asymmetry of the line profiles we have
obtained their ion broadening parameters (A) caused by influence
of the ion microfield on the line broadening mechanism and also
the influence of the ion dynamic effect (D) on the line shape.
Our A and D parameters represent the first data obtained
experimentally by the use of the line profile deconvolution
procedure. We have found stronger influence of the ion
contribution to these He I line profiles than the
semiclassical theoretical approximation provides. This can be
important for some astrophysical plasma modeling or diagnostics.
Key words: plasmas - line: profiles - atomic data
After hydrogen, helium is the most abundant element in the
universe. Helium atoms and ions are present in many kinds of
cosmic light sources and their radiation is very useful for
astrophysical plasma diagnostical purposes (Griem 1974, 1997). In
spite of this special role have the 447.15 nm (2p P
-4d
D
transition), 587.56 nm (2p
P
-3d
D
transition) and 667.82 nm (2p
P
-3d
D
transition)
neutral helium (He I) spectral lines. Recently, in the work
by Benjamin et al. (2002) these have been used to investigate the radiative
transfer effects for a spherically symmetric nebula with no
systematic velocity gradients. Izotov et al. (2001) use these lines to
derive the
He abundance in the Metal-deficient Blue
Compact Dwarf Galaxies Tol 1214-277 and Tol 65
.
In the
work by Harvin et al. (2002) the 667.82 nm line profile has been used to
investigate the physical properties of the Massive Compact Binary
in the Triple Star System HD 36486 (
Orionis A). The
587.56 nm spectral line has been used by Labrosse & Gouttebroze (2001) to estimate
the formation of the helium spectrum in solar quiescent
prominences and, also, by Muglach & Schmidt (2001) to determine the height
and dynamics of the quiet solar chromosphere at the limb.
Therefore, the use of these He I spectral lines for
diagnostic purposes in astrophysics needs the knowledge of their
line profile characteristics. In plasmas with electron densities
(N) higher than 10
m
,
where the Stark
effect begins to play an important role by the He I
spectral lines broadening, knowledge of the Stark broadening
characteristics is necessary. A significant number of theoretical
and experimental studies are devoted to the He I Stark FWHM(full-width at half intensity maximum, W) investigations
(Lesage & Fuhr 1999, and references therein). The aim of this work is
to present measured Stark broadening parameters of the mentioned
He I spectral lines at (8000-33 000) K electron
temperatures (T) and at electron densities of (0.3-8.2)
10
m
.
The T-values used are
typical for many cosmic light sources. Using a deconvolution
procedure described by Milosavljevic & Poparic (2001) we have obtained, for the
first time, on the basis of the observed line profile asymmetry,
the ion contribution to the line shape from the quasistatic ion
(parameter A) and ion dynamic effect (coefficient D)
(Griem 1974; Barnard et al. 1974; Bassalo et al. 1982) and, also, the separate electron
(
)
and ion (
)
contributions to the total
Stark width (
). As a plasma source we have used a
linear, low-pressure, pulsed arc operated in five various
discharge conditions. Our measured
,
,
and A values have been compared to all available
theoretical and experimental data.
The modified version of the linear low pressure pulsed arc
(Djenize et al. 1992, 1998, 2002; Milosavljevic et al. 2000, 2001) has been used as a plasma
source. A pulsed discharge
was driven in a quartz discharge tube
at different inner diameters and plasma lengths. Varying the
dimensions of the discharge tube offers the possibility of
electron temperature variation within a wide range. The working
gas was helium - nitrogen - oxygen mixture (90% He + 8% N
+
2% O
). The tube geometry used and the corresponding discharge
conditions are presented in Table 1.
C | U | H | ![]() |
P | ![]() |
![]() |
![]() |
![]() |
8 | 4.5 | 6.2 | 5 | 267 | 6.1 | 0.7 | 33.0 | 16.0 |
14 | 4.2 | 14.0 | 25 | 267 | 8.2 | 0.9 | 31.5 | 14.5 |
14 | 3.4 | 14.0 | 25 | 267 | 6.7 | 0.8 | 30.0 | 14.0 |
14 | 2.6 | 14.0 | 25 | 267 | 4.4 | 0.3 | 28.0 | 12.5 |
14 | 1.5 | 7.2 | 5 | 133 | 5.0 | 0.6 | 18.0 | 8.0 |
Spectroscopic observation of spectral lines was made end-on along the axis of the discharge tube with (1.8-2.0) mm beam diameter.
The line profiles were recorded by a step-by-step technique using
a photomultiplier (EMI 9789 QB and EMI 9659B) and a grating
spectrograph (Zeiss PGS-2, reciprocal linear dispersion 0.73 nm/mm
in the first order) system. The instrumental FWHM of 8 pm was
obtained by using narrow spectral lines emitted by the hollow
cathode discharge. The spectrograph exit slit (10 m) with the
calibrated photomultipliers was micrometrically traversed along
the spectral plane in small wavelength steps (7.3 pm). The
averaged photomultiplier signal (five shots in each position) was
digitized using an oscilloscope, interfaced to a computer.
The plasma reproducibility was monitored by the He I (501.5 nm, 388.8 nm and 587.6 nm) lines radiation and, also, by the
discharge current using the Rogowski coil signal (it was found to be within 5%). Using the double plasma length method,
described in Milosavljevic (2001), an absence of self-absorption was
found in the case of the investigated line profiles.
The details of the deconvolution procedure used were described by
Milosavljevic & Poparic (2001) and Milosavljevic (2001), and summarized in Sect. 3.
Briefly, it concerns a new advanced numerical procedure for the
deconvolution of theoretical asymmetric convolution integral of a Gaussian and a plasma broadened spectral line profile jA,R()
for spectral lines. This method gives complete
information on the plasma parameters from a single recorded
spectral line. The method determines all broadening (
,
,
,
A and D) and plasma parameters (Nand T) self-consistently and directly from the shape of spectral
lines without any assumptions or prior knowledge.
All one needs to
know is the instrumental width of the spectrometer. The measured
profiles are the result of convolution of the spectral line
profiles by Lorentzian and Stark broadening, and by Doppler and
instrumental broadening; the last two have Gaussian profiles. Van der Waals and resonance broadenings (Griem 1974) were estimated
to be smaller by more than an order of magnitude in comparison to
Stark, Doppler and instrumental broadenings. The deconvolution
procedure was computed using the least Chi-square function
(Milosavljevic & Poparic 2001; Milosavljevic 2001) (see Sect. 3).
The plasma parameters were determined using standard diagnostic
methods. Thus, the electron temperature was determined from the
ratios of the relative line intensities of four N III
spectral lines (409.74 nm, 410.34 nm, 463.42 nm and 464.06 nm)
to the 463.05 nm N II spectral line with an estimated
error of 10% (for index 1 in Table 1) and
30% (for index 2 in Table 1), assuming the
existence of LTE (Griem 1974). All the necessary atomic data were
taken from NIST (2002) and Glenzer et al. (1994). The electron density
decay was measured using a well-known single wavelength He-Ne
laser interferometer technique (with 1.5 mm laser beam diameter)
for the 632.8 nm transition with an estimated error of
9%
(for index 1 in Table 1) and
50% (for index 2 in
Table 1). The electron densities and temperatures,
obtained at the moment when the line profiles were analyzed, are
presented in Table 1.
We monitored the 447.15 nm line profile up to the 120th s after the beginning of the discharge when the electron
density has dropped down to (3.0-9.0)
10
m
and the electron temperature to (8000-16 000) K.
With these plasma parameters the 447.15 nm line can be used as
isolated and separated from its 447.0 nm forbidden component
(Milosavljevic & Djenize 2001). The asymmetric 447.15 nm line profile, as example,
is presented in Fig. 1 with the obtained broadening
parameters and its negligible forbidden component.
The proposed function for various line shapes, Eq. (1)
is of the integral form and includes several parameters. Some of
these parameters can be determined in separate experiments, but
not all of them. Furthermore, it is impossible to find an
analytical solution for the integrals and methods of numerical
integration to be applied. This procedure, combined with the
simultaneous fitting of several free parameters, requires a number
of computer-supported mathematical techniques.
![]() |
Figure 1:
Recorded profile of the 447.15 nm line at given T and N.
![]() ![]() ![]() ![]() ![]() |
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For the purpose of the deconvolution iteration process we need to know the value of K function (1) as a function of
for every group of parameters (
,
,
,
,
R, A). The function K(
)
is in integral form and we have to solve a triple
integral in each step of the iteration process of varying the
above group of parameters. The first integral in the K function is
the microfield strength distribution function,
(
), the second one is the jA,R(
)
function, and the third is the convolution integral of a Gaussian
with a plasma broadened spectral line profile jA,R(
)
(denoted by K(
)
in Eq. (1)).
None of these integrals has an analytic solution and they must be
solved using numerical integration (Milosavljevic & Poparic 2001; Milosavljevic 2001).
After numerical integration the fitting procedure itself can be
started. For Eq. (1), the fitting procedure will give
the values for ,
,
,
R, A and
.
We use the standard manner of defining the best fit: the sum of
the squares of the deviations (
)
of the theoretical
function from the experimental points is at its minimum. The
necessary condition for the minimum of
is
that the partial derivatives of the function are equal to zero.
Therefore, for the K profile we have a system of six nonlinear
homogeneous equations with six parameters. The numerical solutions
of these systems are found using Newtons method of successive
approximations (Milosavljevic & Poparic 2001; Milosavljevic 2001).
Newtons method requires successive solving of the inverse Jacobi matrices of the system of equations for each step, which are subject to rounding errors. Moreover, the numerical partial derivatives in Jacobi matrix itself are sources of rounding errors. These rounding errors destabilize the convergence of the system, although all mathematical conditions are fulfilled. The algorithm may be stabilized by reducing the iteration procedure to independent parameters only (Milosavljevic & Poparic 2001; Milosavljevic 2001).
This sophisticated deconvolution method, which allows the direct
determining of all six parameters by fitting theoretical K-profile (1), to experimental data, requires a sufficient
number of experimental points per line, and small statistical
errors. The method requires a minimum of twenty experimental
points per line (the border of line is (-3/2+
+3/2
+
), where
is the FWHM), and the maximal statistical
indeterminacy in intensity is 5% at every experimental point.
The plasma-broadening parameters (,
,
,
A, D) of the recorded line profiles at measured N
and T values obtained by our deconvolution procedure are presented
in Table 2 together with the results of other authors.
Various theoretical (G, BCW, DSB) predictions of the
,
,
and A are also given. For the normalization of the
AG and
values to our electron density the
numerical factor (Griem 1974) was used.
T | N |
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Ref. |
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587.56 nm | |||||||||||||
33.0 | 6.1 | 210 | 172 | 38 | 0.163 | 1.46 | Tw | 215 | 156 | 183 | 42 | 0.093 | 0.118 |
31.5 | 8.2 | 268 | 218 | 50 | 0.176 | 1.40 | Tw | 289 | 213 | 246 | 55 | 0.100 | 0.127 |
30.0 | 6.7 | 218 | 179 | 39 | 0.167 | 1.46 | Tw | 237 | 175 | 201 | 45 | 0.095 | 0.120 |
28.0 | 4.4 | 151 | 126 | 25 | 0.150 | 1.57 | Tw | 155 | 117 | 132 | 29 | 0.086 | 0.108 |
18.0 | 5.0 | 150 | 126 | 24 | 0.156 | 1.60 | Tw | 176 | 134 | 150 | 31 | 0.088 | 0.108 |
20.9 | 1.03 | 39 | K | ||||||||||
45.0 | 15.9 | 550 | B | ||||||||||
31.0 | 5.4 | 200 | KK | ||||||||||
16.5 | 1.7 | 0.05* | RS | ||||||||||
3.70 | 2.25 | 91 | PL | ||||||||||
52.0 | 10.2 | 3160 | BG | ||||||||||
667.82 nm | |||||||||||||
33.0 | 6.1 | 481 | 298 | 183 | 0.459 | 1.18 | Tw | 397 | 345 | 358 | 170 | 0.282 | 0.309 |
31.5 | 8.2 | 628 | 370 | 258 | 0.498 | 1.12 | Tw | 533 | 467 | 502 | 226 | 0.300 | 0.328 |
30.0 | 6.7 | 512 | 315 | 197 | 0.474 | 1.17 | Tw | 439 | 389 | 402 | 181 | 0.282 | 0.306 |
28.0 | 4.4 | 337 | 216 | 121 | 0.420 | 1.27 | Tw | 290 | 257 | 266 | 117 | 0.252 | 0.265 |
18.0 | 5.0 | 361 | 240 | 121 | 0.413 | 1.26 | Tw | 358 | 323 | 323 | 124 | 0.249 | 0.271 |
20.9 | 1.03 | 98 | K | ||||||||||
30.1 | 3.2 | 231 | P | ||||||||||
19.3 | 0.25 | 22 | M | ||||||||||
20.0 | 10.0 | 960 | Ga | ||||||||||
26.0 | 7.1 | 620 | VK | ||||||||||
447.15 nm | |||||||||||||
16.0 | 0.7 | 237 | 106 | 131 | 0.917 | 1.0 | Tw | 162 | 150 | 140 | 113 | 0.636 | 0.668 |
14.5 | 0.9 | 316 | 145 | 171 | 0.911 | 1.0 | Tw | 212 | 200 | 185 | 142 | 0.668 | 0.704 |
14.0 | 0.8 | 258 | 120 | 138 | 0.883 | 1.0 | Tw | 190 | 180 | 165 | 125 | 0.642 | 0.675 |
12.5 | 0.3 | 101 | 48 | 53 | 0.806 | 1.03 | Tw | 73 | 69 | 63 | 45 | 0.491 | 0.517 |
8.0 | 0.6 | 203 | 103 | 100 | 0.825 | 1.0 | Tw | 155 | 147 | 134 | 82 | 0.554 | 0.574 |
20.9 | 1.03 | 109 | K | ||||||||||
20.0 | 13 | 4500 | B |
In order to make the comparison between measured (
)
and calculated (
)
total (electron +
ion) width values easier, the dependence of the ratio
/
on the electron temperature is
presented graphically in Figs. 2-4 for the
three researched lines.
The
(Griem 1974) and
(Bassalo et al. 1982) values are calculated using Eq. (226) from
Griem (1974) with the
and A values predicted by the
G (Griem 1974) and BCW (Bassalo et al. 1982) theoretical approaches,
respectively. The
/
ratios related to the Dimitrijevic & Sahal-Bréchot (1990) data have been calculated only
for our experimental values. Namely, for the
calculations it is necessary to know the helium ion concentration
connected to the plasma composition. We have performed this for
our discharge conditions only.
It turns out that our
and
are the first separate experimental electron and ion Stark
width results obtained by using our deconvolution procedure
(Milosavljevic & Poparic 2001). Our
results are smaller than
the G approximation for all the three investigated lines. The
greatest disagreement was found for the 447.15 nm line. It is
about 53%. The other two approximations (BCW and DSB), in the
case of the 667.82 nm and 447.15 nm lines, provide smaller
values than the G approximation, but they are also
higher than ours. For the 587.56 nm line the
,
and
values show
a reasonable mutual agreement (within
12% experimental
accuracy). It is pointed out that the
values calculated
by Freudenstein & Cooper (1978) and Dimitrijevic & Konjevic (1986), for the 667.82 nm line,
exceed all other
data presented in Table 2.
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Figure 2:
Ratios of the experimental total Stark FWHM(
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Figure 3:
Ratios of the experimental total Stark FWHM(
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Figure 4:
Ratios of the experimental total Stark FWHM (
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Open with DEXTER |
Inspecting Figs. 2-4 one can conclude that the
Griem (1974)
values lie above all experimental and
theoretical data except the results from experiments reported by
Puric et al. (1970), Mijatovic et al. (1995) and Kelleher (1981). This is clear in
the case of the 667.82 nm line at higher electron temperatures
(see Fig. 3). Theoretical
values presented by
Bassalo et al. (1982) lie about 10%-30% below Griem's values. The
values (
+
)
presented by
Dimitrijevic & Sahal-Bréchot (1990) agree with ours (
)
to within
3%-18% with the best agreement for the 447.15 nm line (see Fig. 4).
We have found a clear contribution of the ion influence to the
line broadening due to the quasistatic ion effect expressed with
the ion broadening parameter (A). Our
values are
the first data obtained directly by the use of the line
deconvolution procedure. They are higher than what the G and BCW
approaches yield by about: 75% and 38% (for the 587.56 nm
line), 40% and 34% (for the 667.82 nm line), 31% and 28% (for
the 447.15 nm line), respectively. Furthermore, we have found
that the ion dynamic effect, expressed as the D coefficient,
multiplies the quasistatic ion contribution by about 1.5 for the
587.56 nm line and 1.2 for the 667.82 nm line. For the
447.15 nm line the ion dynamic effect is negligible (D=1). It
should be pointed out that we have found good agreement between
our
/
and theoretical
/
(Dimitrijevic & Sahal-Bréchot 1990) ratio
values. These are: 18.5% (18.0%), 37.5% (30.5%) and 53%
(44%) for the 587.56 nm, 667.82 nm and 447.15 nm lines,
respectively. As can be seen, this agreement is within the
estimated experimental accuracies (
12%) of the
and
values. One can conclude
that the ion contribution to the total line width increases with
the upper-level energy of the transition and plays a more
important role than what the G and BCW approximations provide.
It turns out that the single
value, obtained by
Roder & Stampa (1964), presented with an asterisk in Table 2,
represents the 587.56 nm line asymmetry factor obtained at the
line half intensity maximum. This is about 2.4 times smaller than
our
value.
Using a line deconvolution procedure (Milosavljevic & Poparic 2001; Milosavljevic 2001) we
obtained, on the basis of precisely recorded He I spectral
line profiles, their Stark broadening parameters: ,
,
,
A and D. We found that the ion contribution to the line
profiles plays a more important role than the semiclassical
approximation provides, which must be taken into account in the
use of these He I lines for plasma diagnostical purposes
according to the estimations made by the semiclassical
perturbation formalism (Dimitrijevic & Sahal-Bréchot 1990).
Acknowledgements
This work is a part of the project "Determination of the atomic parameters on the basis of the spectral line profiles'' supported by the Ministry of Science, Technologies and Development of the Republic of Serbia. S. Djenize is grateful to the Foundation "Arany János Közalapitvány'' Budapest, Hungary.