Volume 405, Number 3, July III 2003
|Page(s)||1169 - 1176|
|Published online||30 June 2003|
Increasing the reliability of ISOCAM cross-identifications by use of a probability pattern*
Observatoire Astronomique de Strasbourg, 11 rue de l'Université, 67000 Strasbourg, France
2 ISO Data Centre, Science Operations and Data Systems Division, European Space Agency, Villafranca del Castillo, PO Box 50727, 28080 Madrid, Spain e-mail: email@example.com
3 CEA/DSM/DAPNIA Saclay, Service d'Astroph., L'Orme de Merisiers, Bat. 709, 91191 Gif-sur-Yvette, France e-mail: firstname.lastname@example.org
Corresponding author: S. Derriere, email@example.com
Accepted: 13 March 2003
The built-in play at the wheels of the ISOCAM instrument affects the accuracy of the astrometry of sources from the ISOCAM Parallel Catalogue. We present the results of different methods for cross-identifying ISOCAM sources with reference catalogues in the optical (USNO-A2.0) and in the near infrared (2MASS). For a sample of 7197 ISOCAM sources, the fraction having a real counterpart in the USNO and 2MASS catalogues was estimated to be 95% and 91% respectively. Using a nearest neighbor method for cross-identification, only 74% of the possible associations with USNO (79% with 2MASS) are retrieved. With the use of a so-called probability pattern to perform the associations, these values increase to 77% for USNO and 83% for 2MASS. In addition, the overall reliability of associations increases from 77 to 87% with USNO, and from 81 to 90% with 2MASS.
Key words: catalogs / astrometry / methods: data analysis / methods: statistical / infrared: general
© ESO, 2003
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.