Volume 393, Number 2, October II 2002
|Page(s)||721 - 726|
|Section||Catalogs and data|
|Published online||23 September 2002|
Ion contribution to the astrophysical important 447.15, 587.56 and 667.82 nm He I spectral lines broadening
Faculty of Physics, University of Belgrade, PO Box 368, Belgrade, Serbia, Yugoslavia
2 Isaac Newton Institute of Chile, Yugoslavia Branch, Belgrade, Yugoslavia
3 Hungarian Academy of Sciences, Budapest, Hungary
Accepted: 9 August 2002
Characteristics of the astrophysical important Stark broadened 447.15 nm, 587.56 nm and 667.82 nm spectral line profiles have been measured at electron densities between 0.310 and 8.210 m and electron temperatures between 8000 and 33 000 K in plasmas created in five various discharge conditions using a linear, low-pressure, pulsed arc as an optically thin plasma source operated in a helium-nitrogen-oxygen gas mixture. On the basis of the observed asymmetry of the line profiles we have obtained their ion broadening parameters (A) caused by influence of the ion microfield on the line broadening mechanism and also the influence of the ion dynamic effect (D) on the line shape. Our A and D parameters represent the first data obtained experimentally by the use of the line profile deconvolution procedure. We have found stronger influence of the ion contribution to these line profiles than the semiclassical theoretical approximation provides. This can be important for some astrophysical plasma modeling or diagnostics.
Key words: plasmas / line: profiles / atomic data
© ESO, 2002
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