All systematic effects: third-order (upper panel) and fourth-order (lower panel) moments estimated on seven wavelet bands of the original convergence with realistic noise (black) compared to the moments estimated using KS (blue) and KS+ (red) obtained from incomplete noisy shear maps. The third- and fourth-order moments are estimated outside the mask. The shaded area represents the uncertainties on the mean estimated on 1000 deg². Lower panel: relative higher-order moment errors.