All Figures

	Figure 1: The relation of an ATLAS9 model computed for solar abundances for all the elements (solid line) is compared with the relation of an ATLAS12 model computed with the individual abundances of HD 175640 (dotted line). Model parameters are  = 12 000 K,  = 3.95,  = 0 km s-1.
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In the text

Figure 2: Two synthetic profiles of He I 400.9257 nm differing only in the Stark damping constants are compared with the observations (full thin line). The thick line shows the profile computed with the Stark widths and shifts from Dimitrijevic & Sahal-Bréchot (1990), the dotted line shows the profile computed with the approximate Stark damping constant yielded by the SYNTHE code (Kurucz & Avrett 1981) when it is not available from the literature. We used the model for HD 175640 having parameters  = 12 000 K,  = 3.95, microturbulent velocity  = 0 km s-1. The synthetic profiles are also broadened for  = 2.5 km s-1 and for a Gaussian instrumental profile with 110 000 resolving power.

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In the text

Figure 3: The observed profiles (thick full lines) of Mn II at  735.3549 and 741.5803 nm are compared with synthetic profiles computed once without any hyperfine structure (dotted lines) and once with hyperfine structure (thin full lines). The meaning of the line identification labels like 486 25.01 29889 813 is: 486, last 3 digits of wavelength in nm (735.3486); 25.01, element (25) and charge (01), i.e. Mn II; 29889, lower energy level in cm-1; 813, per mil residual flux of the isolated line before rotation.

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In the text

Figure A.1: Comparison of observed (thick line) and computed (thin line) profiles of He I 402.6, 438.7, 447.1 and 667.8 nm. The meaning of the line identification labels like 547 26.01 36252 769 is: 547, last 3 digits of wavelength in nm (402.4547); 26.01, element (26) and charge (01), i.e. Fe II; 36252, lower energy level in cm-1; 769, per mil residual flux of isolated line before rotation.


In the text

Figure A.2: Observed emissions at the position of C I 833.5148 nm and C I 940.5730 nm. Observed spectrum (thick line), stellar synthetic spectrum (thin line), and telluric synthetic spectrum (dotted line) are superimposed. The meaning of the identification labels is the same as that given in the caption of Fig. A.1.


In the text

Figure A.3: Synthetic LTE profiles of O I triplet mult. 1 at 777.2-777.5 nm computed with two different oxygen abundances, -3.18 dex (thin line) and -2.10 dex (dotted line), are compared with the observed profiles (thick line). The first abundance is the average abundance from selected equivalent widths (see text) the second abundance is that derived from the equivalent widths of the O I triplet mult. 1 lines. Increasing the O I abundance does not reduce the disgreement between the observed and computed profiles. The meaning of the identification labels is the same as that given in the caption of Fig. A.1.


In the text

Figure A.4: Comparison of the observed Ca II K and H profiles (thick line) with the computed ones (thin line). A bump can be observed on the red side of Ca II K while an unidentified red component is well detectable on the red wing of Ca II H. The meaning of the identification labels is the same as that given in the caption of Fig. A.1.


In the text

Figure A.5: Observed emission lines at the position of Ti II 602.9271 nm ( left panel, thick line) and of Cr II 658.5241 nm and Cr II 658.7020 nm ( right panel, thick line). The thin line is the synthetic spectrum. The meaning of the identification labels is the same as that given in the caption of Fig. A.1.


In the text

Figure A.6: The observed profiles (thick full lines) of Ga II at  536.03, 541.63, 641.89, 641.93, and 645.65-645.68 nm are compared with synthetic profiles computed once without any hyperfine structure (dotted lines) and once with hyperfine structure included in the computations (thin full lines) The meaning of the identification labels is the same as that given in the caption of Fig. A.1.


In the text