A&A 411, L257-L260 (2003)
DOI: 10.1051/0004-6361:20031226
Letter
JEM-X science analysis software
N. J. Westergaard1, P. Kretschmar2, 3, C. A. Oxborrow1, S. Larsson4, J. Huovelin5, S. Maisala5, S. Martínez Núñez6, N. Lund1, A. Hornstrup1, S. Brandt1, C. Budtz-Jørgensen1 and I. L. Rasmussen11 Danish Space Research Institute Juliane Maries Vej 30, 2100 Copenhagen, Denmark
2 Max-Planck-Institut für Extraterrestrische Physik Giessenbachstrasse, 85748 Garching, Germany
3 INTEGRAL Science Data Centre, Chemin d'Écogia 16, Versoix, Switzerland
4 Stockholm University Roslagstullgatan 21, Stockholm, Sweden
5 Observatory, PO Box 14, 00014, University of Helsinki, Finland
6 GACE, Instituto de Ciencias de los Materiales, Universidad de Valencia, PO Box 20085, 46071 Valencia, Spain
(Received 7 July 2003 / Accepted 8 August 2003)
Abstract
The science analysis of the data from JEM-X on INTEGRAL is performed through
a number of levels including corrections, good time selection, imaging
and source finding, spectrum and light-curve extraction.
These levels consist of individual executables and the running of the
complete analysis is controlled by a script where parameters for
detailed settings are introduced. The end products are FITS files
with a format compatible with standard analysis packages such as
XSPEC.
Key words: software -- X-ray data analysis -- INTEGRAL satellite -- JEM-X
Offprint request: N. J. Westergaard, njw@dsri.dk
© ESO 2003
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