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Issue A&A
Volume 411, Number 1, November III 2003
Special letters issue on: first science with integral
Page(s) L117 - L121
Section Letters
DOI 10.1051/0004-6361:20031365



A&A 411, L117-L121 (2003)
DOI: 10.1051/0004-6361:20031365

Letter

SPI-specific analysis method and software overview

R. Diehl1, N. Baby2, V. Beckmann3, 4, P. Connell5, P. Dubath3, P. Jean2, J. Knödlseder2, J.-P. Roques2, S. Schanne6, C. Shrader7, G. Skinner2, A. Strong1, S. Sturner7, B. Teegarden7, A. von Kienlin1 and G. Weidenspointner

2, 7, 8

1  Max-Planck-Institut für extraterrestrische Physik, 85741 Garching, Germany
2  Centre d'Étude Spatiale des Rayonnements, 31028 Toulouse, France
3  Integral Science Data Center, 1290 Versoix, Switzerland
4  Institut für Astronomie und Astrophysik, Universität Tübingen, 72076 Tübingen, Germany
5  University of Birmingham, Birmingham, UK
6  DSM/DAPNIA/Service d'Astrophysique, CEA Saclay, 91191 Gif-Sur-Yvette, France
7  NASA/Goddard Space Flight Center, Greenbelt, MD 20771, USA
8  Universities Space Research Association, Seabrook, MD 20706, USA

(Received 15 July 2003 / Accepted 4 September 2003)

Abstract
The SPI spectrometer on INTEGRAL features a camera system with 19 Ge detector modules, imaging photons through a tungsten coded mask. Background is reduced by an anticoincidence detector system surrounding these. The specifics of this instrument lead to data correction and analysis methods which are described here. Raw data for science analysis are detector event messages and spectra for different categories of detector hits and pulse shapes. Preprocessing combines calibrated spectra from these, which are then interpreted using the imaging and spectral response function for measured spectra where parts of the detector plane are occulted by the mask. Background dominates the overall signal, tailored background estimates and models are based on instrument-specific signatures, their correlations, and trends.


Key words: gamma-rays: observations -- methods: data analysis

Offprint request: R. Diehl, rod@mpe.mpg.de

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